A Defect Inspection Method in TFT-LCD Panel Using LS-SVM
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Korean Institute of Intelligent Systems
سال: 2009
ISSN: 1976-9172
DOI: 10.5391/jkiis.2009.19.6.852